SEU、故障和系统级安全

SEU 或单粒子翻转是设备或系统内存储元件的状态变化。这属于某种系统故障,但这种故障可能长达数年都悄无声息,因为系统会继续按预期运行。本文论述了如何能通过系统级方法减缓 SEU 和其他影响功能安全系统的潜在故障的负面影响。在不增加用户其他周期性或验证性测试要求的前提下,这能在系统寿命范围内将功能安全系统的预计危险故障率降低一个数量级。

To get this white paper, please fill in this form and you will receive an email with a download link.

点击这里登录并自动填写此表单

I accept the Website Terms of Use

Data protection – The information you provide on this form will be held on file by Artesyn on a database and will be used for the purposes of promotion of Artesyn products, services and other stories. By submitting this form, you consent to the use of your personal data for these purposes.

We use a tool called Mailchimp to manage our subscriber lists, so when you apply to join, you will receive an email from Mailchimp to confirm that you wish to join the Artesyn mailing list (the email will be from an address such as Artesyn Embedded Technologies <info@mail1.mcsignup.com>). Please click on the link in the email – this is to help us protect your privacy. You can unsubscribe at any time.

Corporate website design by Freshleaf Media