SEU 或单粒子翻转是设备或系统内存储元件的状态变化。这属于某种系统故障,但这种故障可能长达数年都悄无声息,因为系统会继续按预期运行。本文论述了如何能通过系统级方法减缓 SEU 和其他影响功能安全系统的潜在故障的负面影响。在不增加用户其他周期性或验证性测试要求的前提下,这能在系统寿命范围内将功能安全系统的预计危险故障率降低一个数量级。

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